x ray diffractometer

The x ray diffractometer Companion is an advanced benchtop X-ray diffractometer designed for high performance and routine control. By combining ?/? Bragg-Brentano geometry with state-of-the-art technical features, it delivers accuracy, precision, safety, and ease of use. One-click data treatment software ensures reliable results, enabling efficient daily analysis.

$x ray diffractometer$

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x ray diffractometer

Advanced Analytical Capabilities

By integrating θ/θ Bragg-Brentano geometry with precise collimation and advanced detection, the system generates consistent, reproducible diffraction data, making it an effective platform for routine industrial and research analysis.

Key Features

Decoupled θ/θ goniometer maintaining angular accuracy of ±0.01° over full measurement range.

Wide angular measurement range spanning from -5° to +155° two-theta degrees.

TPX3 2-D solid state detector supporting 0D, 1D, and 2D detection modes.

Six-position sample changer with spinner enabling higher throughput and better statistics.

Solstix Pronto software delivers one-click Rietveld analysis with optional LIMS automation.

Built-in shielded cabinet with lead glass windows and safety interlocks ensuring compliance.

Designed for routine X-ray diffraction control, the system supports qualitative and quantitative analysis of powder, thin film, and in-situ samples across polycrystalline materials. Widely adopted across cement, lithium battery, mining, and materials industries, it enables researchers to generate physiologically relevant crystallographic models with improved reproducibility, long-term analytical reliability, and stronger phase quantification correlation.

Versatile Applications