Benchtop X-Ray Diffractometer, advanced XRD system for Rietveld phase analysis and QA/QC
The X-ray Diffractometer Companion is an advanced benchtop X-ray diffractometer designed for high performance and routine control. By combining ?/? Bragg-Brentano geometry with state-of-the-art technical features, it delivers accuracy, precision, safety, and ease of use. One-click data treatment software ensures reliable results, enabling efficient daily analysis.
X-Ray Diffractometer
X-Ray Diffractometer
X-Ray Diffractometer
Benchtop X-Ray Diffractometer, advanced XRD system for Rietveld phase analysis and QA/QC
The X-ray Diffractometer Companion is an advanced benchtop X-ray diffractometer designed for high performance and routine control. By combining ?/? Bragg-Brentano geometry with state-of-the-art technical features, it delivers accuracy, precision, safety, and ease of use. One-click data treatment software ensures reliable results, enabling efficient daily analysis.
Advanced Analytical Capabilities
By integrating θ/θ Bragg-Brentano geometry with precise collimation and advanced detection, the system generates consistent, reproducible diffraction data, making it an effective platform for routine industrial and research analysis.
Key Features
Designed for routine X-ray diffraction control, the system supports qualitative and quantitative analysis of powder, thin film, and in-situ samples across polycrystalline materials. Widely adopted across cement, lithium battery, mining, and materials industries, it enables researchers to generate physiologically relevant crystallographic models with improved reproducibility, long-term analytical reliability, and stronger phase quantification correlation.
Versatile Applications